Learn How AFM Adds New Layers of Understanding for Thin Film R&D

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)

Learn about techniques to characterize:

• High resoloution morphology and roughness
• Solvent and thermal effects
• Electrical, electromechanical and magnetic response
• Mechanical properties (storage and loss moduli)
• Nanoscale friction (tribology)

See actual examples on materials including:

• Strain in ferroelectric thin films formed by MOCVD
• Plasma treatment of polmer thin films for improved coating adhesion
• Ultra-flat strontium vanadate (SVO) grown by pulsed electron deposition
• Temperature-dependent in epitaxial BiFeO₃ (BFO) multiferroic film
• Solvent annealing of a polymer thin film
• Roughness of zinc film grown by electrodeposition
• Magnetic properties of a ferromagnetic FePt film grown by pulsed laser deposition (PLD)
• Frictional modification of a surface with layered polymer brush-gel films