原子力显微镜
AFM配件
应用
联系我们
牛津仪器集团成员
Contact mode
DART PFM
Dual AC™
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM
AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
High voltage PFM
iDrive™ (magnetically actuated tapping mode in fluid)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Thermal Microscopy (SThM)
Scanning Tunneling Microscopy (STM)
Ztherm™ Modulated Thermal Analysis
Tools for quantitative characterization of visoelastic properties, including elastic modulus, loss modulus, loss tangent, as well as for measurement of thermal properties
Accessories for subjecting your sample to other driving forces like magnetic fields, mechanical strain, high voltage fields, and more.
Tools for measuring electrical properties, including current, resistivity and permittivity, and more. Also includes PFM, STM, and EC-AFM techniques
Additional options to make the MFP-3D work for you
© 牛津仪器 2024
公安机关备案号31010402003473
