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MFP-3D Origin+ 原子力显微镜

AsylumResearch MFP-3D Origin+ 原子力显微镜是一款性能稳定,功能多样,扩展性强的原子力显微镜。它也是一款科研级的AFM,可用于多种研究领域。其核心性能与MFP-3D Origin相同,另外还支持多种MFP-3D专属配件。

  • 这款AFM性能稳定、功能多样

  • 支持多种成像模式和配件

  • 坚固耐用,适合繁忙的实验室

  • 使用简便,但又不会降低实验的灵活性

  • 提供专业的客户支持服务


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Origin Family Brochure
MFP-3D Accessories

这款AFM性能稳定、功能多样

  • High-resolution imaging in both air and fluid — 120 µm XY range and 15 µm Z (40 µm optional)
  • Accurate, lowest-noise force measurements
  • Modern flexured and sensored scanner design makes the AFM easier to use and improves measurement accuracy
  • Large sample stage makes navigation easy 
  • Engage and scan—quickly, easily, and reliably
  • Rugged, reliable design makes it great for busy labs

支持多种成像模式和配件

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Numerous environmental accessories for temperature control
  • Controlled gas or liquid environment options that are simple, safe, and effective
  • Unique accessories for applying external forces to a wide range of samples

使用简便,但又不会降低实验的灵活性

  • SmartStart™ automatically detects and configures system components to get results quickly
  • ModeMaster™ automatically configures software for selected mode
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging

提供专业的客户支持服务

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and expert applications support for life
  • Extended warranty and repair costs are the lowest in the industry
  • Easy upgrade path to the MFP-3D Infinity

包括以下操作模式

Contact mode
DART PFM
Dual AC™
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

可选的操作模式

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
High voltage PFM
iDrive™ (magnetically actuated tapping mode in fluid)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Thermal Microscopy (SThM)
Scanning Tunneling Microscopy (STM)
Ztherm™ Modulated Thermal Analysis 

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