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AFM配件
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Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electric force microscopy (EFM)
Force curves
Force mapping mode (force volume)
Force modulation
Frequency modulation
Kelvin probe force microscopy (KPFM)
Lateral force mode (LFM)
Loss tangent imaging
Magnetic force microscopy (MFM)
Nanolithography and nanomanipulation
Phase imaging
Piezoresponse force microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Vector PFM
AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Fast Force Mapping Mode (FFM)
Conductive AFM (CAFM)
Current mapping with FFM
Electrochemical Strain Microscopy (ESM)
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Capacitance Microscopy (SCM)
Scanning tunneling microscopy (STM)