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Cypher S AFM

Asylum ResearchCypher S 是一款可商业化的快速扫描AFM,而且Cypher 系列AFM 系列是少有的全功能快速扫描AFM,该系列AFM可兼容各种模式和配件。此外,该系列的优势还在于其更容易获得高分辨率。在材料科学和生命科学研究领域, Cypher S 可以实现在空气和液体环境下的对样品进行高质量的扫描和测量。Cypher S后续还可以通过升级硬件进行环境控制,甚至实现视频速率扫描功能。

  • 容易实现的原子力级高分辨成像

  • 可实现快速扫描,获得扫描图像的结果以秒计,而非分钟

  • 操作的每一步都简单、方便,效率高

  • 实验室占用空间小,研发能力提升潜力巨大

  • 专业的售后支持和服务


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Cypher 系列产品使用手册

能够获得更高的分辨率

  • Unmatched mechanical stability—noise floor half  that of any other AFM
  • Exceptionally low drift—higher resolution and straight lattice lines
  • Low noise electronics—no artifacts from electronic noise sources

 

可实现快速扫描,获得扫描图像的结果以秒计,而非分钟

  • Scans 10-100× faster than typical AFMs
  • Supports the fastest, smallest probes (3×9 µm spot size—optional)
  • Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM

 

操作的每一步都简单、方便,效率高

  • ModeMaster™ automatically configures software for selected mode
  • SpotOn™ makes the fully motorized laser and detector alignment one-click
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • etStarted™ automatically sets optimal parameters for tapping mode imaging
  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative

 

实验室占用空间小,研发能力提升潜力巨大

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging
  • Many standard operating modes and even more optional modes

 

专业的售后支持和服务

  • Includes a standard two-year comprehensive warranty
  • No-charge technical support and expert applications support for life
  • Extended warranty and repair costs are the lowest in the industry

包括以下操作模式

Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

可选的操作模式

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)

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