Cypher S AFM

能够获得更高的分辨率

• Unmatched mechanical stability—noise floor half  that of any other AFM
• Exceptionally low drift—higher resolution and straight lattice lines
• Low noise electronics—no artifacts from electronic noise sources

可实现快速扫描，获得扫描图像的结果以秒计，而非分钟

• Scans 10-100× faster than typical AFMs
• Supports the fastest, smallest probes (3×9 µm spot size—optional)
• Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM

操作的每一步都简单、方便，效率高

• ModeMaster™ automatically configures software for selected mode
• SpotOn™ makes the fully motorized laser and detector alignment one-click
• GetReal™ automatically calibrates the cantilever spring constant and sensitivity
• etStarted™ automatically sets optimal parameters for tapping mode imaging
• blueDrive™ makes tapping mode simpler, more stable, and more quantitative

实验室占用空间小，研发能力提升潜力巨大

• Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
• Unmatched range of nanoelectrical and electromechanical characterization modes
• Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging
• Many standard operating modes and even more optional modes

专业的售后支持和服务

• Includes a standard two-year comprehensive warranty
• No-charge technical support and expert applications support for life
• Extended warranty and repair costs are the lowest in the industry