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Ergo: The Future of AFM Control

Ergo is the new software interface included with all Asylum Research Cypher and Jupiter AFMs. A streamlined workflow enables quick setup and simple acquisition of consistent high-quality images. Ergo users will complete their measurements and confidently draw meaningful conclusions in record time.


观看直播

为更好地服务广大客户及设备使用者,Oi Service直播讲堂特别邀请牛津仪器材料分析集团应用科学家 赖佳昀,做了主题为:AFM Ergo软件:成就简单方便的 AFM操作及使用的在线直播。

本次讲座将展示全新Ergo软件的使用方法、功能展示,以及它如何帮助牛津仪器Asylum Research AFM的用户在实验上节省更多的时间,并得到理想的实验数据。如您感兴趣,欢迎点击下方按钮报名参加!

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Automated Multi-Site Wafer Imaging Now Available on Ergo

Upload your sites, hit “Start” and walk away. Ergo will not only scan each site automatically, but the Autopilot™ algorithm will optimize the scans for high quality and consistent results.

Intuitive, Easy to Use Nanoelectrical Workflow

Measure high-resolution, high-sensitivity electrical data with Scanning Capacitance Microscopy (SCM) and Conductive AFM (CAFM).

Auto AFM Calibration in Seconds

Ergo’s workflow guides you from loading a new probe to aligning the laser with a few clicks.  In the background, Asylum’s proprietary GetReal technology automatically calibrates the cantilever each time to help ensure the most consistent results from day-to-day.

 

Rapid Generation of High-Quality Images That You Can Trust

The most common AFM measurement is the acquisition of topographical images in air. Ergo has embedded Asylum’s proprietary AUTOPILOT™ algorithm, which automatically calculates the optimal imaging settings and starts producing high quality data from the first scan line.

 

Ergo AFM software polymer blend image
Polymer blend
AFM is a powerful tool for visualizing the microstrucuture of polymers.
Ergo AFM software PTFE molecular resolution
PTFE membrane
Ergo easily achieves high resolution using AUTOPILOT, here resolving the individual PTFE molecule chains.
Ergo AFM software PMR disk drive media
PMR disk drive media
Roughness and defects are key quality control metrics on disk drive media that affect data storage density.
Ergo AFM software silicon wafer grains
Silicon wafer
Substrate roughness is one of the most common AFM measurements. Ergo makes it simple and repeatable.

Minimal Training Required

Ergo shares a common core and workflow concept with the Oxford Instruments AZtec software for SEM and TEM analyzers. This tried and tested platform allows users to focus on results and not on the equipment.

 

Ergo AFM software screenshot scan in action

Easily Analyze and Present AFM Images

AFM images can be analyzed directly in Ergo without the need for other software. A workflow guides the user to sort, process, and analyze AFM data. Results are stored directly with the images so they cannot be lost, and the raw data is never altered.

 

Ergo AFM software offline histogram

Advanced Mode Operation

Ergo works in concert with Asylum’s IGOR Pro-based software that is supplied with every system. Expert users have the ability to operate the complete range of advanced modes and exercise the full customization capabilities of the AFM. Together, Ergo and Igor provide users with unmatched flexibility to achieve all of their research goals.

 

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