牛津仪器集团成员
扩展

MFP-3D Origin 原子力显微镜

MFP-3D Origin™ 具有Asylum Research产品的稳定性能和高品质。

Origin系列既有稳定的性能,又有实惠的价格。它可以实现高分辨率成像,并支持大尺寸样本、多种成像模式,以及多种配件。因此,Origin系列是一款理想的AFM入门产品!

  • 高品质的科研级AFM

  • 性能稳定:三轴分离设计的扫描器,从原子分辨率扫描至超大的120 µm扫描范围

  • 易于使用、坚固耐用,适合繁忙的实验室

  • 支持多种模式和配件,帮助您获得形貌以外更多的样品信息

  • 易于升级,可通过升级获得新功能

  • 提供专业的售后支持和服务


询价 增加到询价列表

Origin Family Brochure
MFP-3D Accessories

高品质的科研级AFM

  • -resolution imaging in both air and fluid — 120 µm XY range and 15 µm Z (40 µm optional)
  • Accurate, lowest-noise force measurements
  • Modern flexured and sensored scanner makes the easier to use and improves measurement accuracy
  • Large sample stage makes navigation easy
  • Engage and scan—quickly, easily and reliably

易于使用、坚固耐用,适合繁忙的实验室

  • SmartStart™ automatically detects and configures system components to get results quickly
  • ModeMaster™ automatically configures software for selected mode
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging

支持多种模式和配件,帮助您获得形貌以外更多的样品信息

  • Nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Large range of nanoelectrical and electromechanical characterization modes
  • control for heating samples to 275°C
  • Controlled gas or liquid environment options that are simple, safe and effective

专业的支持和售后服务

  • Includes a one-year comprehensive warranty
  • No-charge technical support and expert applications support for life
  • Extended warranty and repair costs are the lowest in the industry
  • Easy upgrade path to the MFP-3D Origin+ or MFP-3D Infinity

包括以下操作模式

Contact mode
DART PFM
Dual AC™
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
modulation
Kelvin Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Force Microscopy ()
Nanolithography
Nanomanipulation
imaging
Piezoresponse Force Microscopy (PFM)
Switching PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

可选操作模式

AM-FM Viscoelastic Mapping Mode
Conductive (CAFM) with ORCA™ and Eclipse™ Mode
iDrive™ (magnetically actuated tapping mode in fluid)
Scanning  Microscopy (SThM)
Scanning Tunneling Microscopy ()

您可能想要…

相关应用

纳米材料生长和表征化学和分子组成的测量结构材料和部件电动汽车技术车用轮胎电池技术太阳能光伏技术太阳能电池的电学及结构表征材料成分和结构机械及电学性能失效分析制造聚合物和聚合物相属性的测定层状聚合物结构的成像与失效分析聚合物添加剂分析低维结构表征光发射装置制造和表征化学反应的原位观察

最新消息

沪ICP备17031777号-1 公安机关备案号31010402003473