原子力显微镜
AFM配件
应用
联系我们
牛津仪器集团成员
Contact mode
DART PFM
Dual AC™
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
modulation
Kelvin Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Force Microscopy ()
Nanolithography
Nanomanipulation
imaging
Piezoresponse Force Microscopy (PFM)
Switching PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM
AM-FM Viscoelastic Mapping Mode
Conductive (CAFM) with ORCA™ and Eclipse™ Mode
iDrive™ (magnetically actuated tapping mode in fluid)
Scanning Microscopy (SThM)
Scanning Tunneling Microscopy ()
Tools for quantitative characterization of visoelastic properties, including elastic modulus, loss modulus, loss tangent, as well as for measurement of properties
Accessories for subjecting your sample to other driving forces like fields, mechanical strain, voltage fields, and more.
Tools for measuring electrical properties, including current, resistivity and permittivity, and more. Also includes PFM, , and EC- techniques
Additional options to make the MFP-3D work for you
© 牛津仪器 2024
公安机关备案号31010402003473
