Probe Selection GuideNeed Help Choosing a Probe?
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force Mapping Mode (force volume)
Kelvin Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Force Microscopy ()
Piezoresponse Force Microscopy (PFM)
Tapping mode (AC mode)
Tapping mode with digital Q control
AM-FM Viscoelastic Mapping Mode
Conductive (CAFM) with ORCA™ and Eclipse™ Mode
iDrive™ (magnetically actuated tapping mode in fluid)
Scanning Microscopy (SThM)
Scanning Tunneling Microscopy ()
Tools for quantitative characterization of visoelastic properties, including elastic modulus, loss modulus, loss tangent, as well as for measurement of properties
Accessories for subjecting your sample to other driving forces like fields, mechanical strain, voltage fields, and more.
Tools for measuring electrical properties, including current, resistivity and permittivity, and more. Also includes PFM, , and EC- techniques
Additional options to make the MFP-3D work for you
Accessories for controlling , the gas environments (gas/vapor composition or humidity), and operating under - oxygen and/or water levels in a glovebox.