牛津仪器集团成员
扩展

AFM Image Gallery: Nanoelectrical Measurements

Select a Sub-Gallery

Conductive AFM (CAFM) Electrostatic Force Microscopy (EFM) Scanning Microwave Impedance Microscopy (sMIM) Surface Potential (KPFM)

Conductive AFM (CAFM)

Electrostatic Force Microscopy (EFM)

回到顶层

Scanning Microwave Impedance Microscopy (sMIM) 

回到顶层

Surface Potential (KPFM)

回到顶层
沪ICP备17031777号-1 公安机关备案号31010402003473