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Is Atomic Force Microscopy the Best Tool for Your Surface Roughness Measurements?
牛津仪器Asylum Research 推出全新一代的SCM,基于微波技术SCM技术进展将大大拓展SCM的应用领域。
中国清华大学以及其它几所著名高校的研究人员利用AFM对控制铁电材料畴壁的电荷传导进行了研究。
伊利诺伊大学厄巴纳-香槟分校(UIUC)的学者们用Cypher系列AFM对碳点的光物理特性进行了深入研究。
Oxford Instruments Asylum Research Releases NanoRack In Situ Tensile and Compression Stage for Jupiter XR Atomic Force Microscope
is a powerful tool for tribology research- the study of friction and wear. Here, is used to investigate a tribofilm formed by reciprocal sliding.
Hafnium oxide helps keep microelectronics on the Moore’s law trajectory
AFM与STM的分辨率之战
令人不安的休战局面已被打破,因为拒绝在分辨率上对让步。