Vero S：干涉式原子力显微镜

Included Operating Modes

Contact mode
DART PFM
Dual AC (Bimodal) 
Dual AC Resonance Tracking (DART)
Electric force microscopy (EFM)
Force curves
Force mapping mode (force volume)
Force modulation
Frequency modulation
Kelvin probe force microscopy (KPFM)
Lateral force mode (LFM)
Loss tangent imaging
Magnetic force microscopy (MFM)
Nanolithography and nanomanipulation
Phase imaging
Piezoresponse force microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode*
Contact Resonance Viscoelastic Mapping Mode*
Fast Force Mapping Mode (FFM)
Conductive AFM (CAFM) with ORCA
Current mapping with FFM
Electrochemical Strain Microscopy (ESM)
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Capacitance Microscopy (SCM)
Scanning microwave impedance microscopy (sMIM)
Scanning tunneling microscopy (STM)

（*这些模式要求Vero S 选配blueDrive光热激发或压电陶瓷驱动的探针夹或样品驱动器）