Learn Why AFM is an Essential Tool for R&D of 2D Materials and Devices

Today’s AFMs reveal not just the morphology of 2D materials, but also sense local electrical, mechanical, and functional properties in more ways than ever before

Application note about the many ways atomic force microscopy can be used to study 2D materials like graphene and molybdenum disulfide (MoS2)

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)

Learn about techniques to characterize:

Nanoscale morphology
Lattice structure
Electrical and functional response
Mechanical properties (storage and loss moduli)

See actual examples on materials including:

CVD growth of molybdenum disulfide (MoS₂)
Graphene exfoliation in ionic liquids
Lattice structure of a 2D optoelectronic material
Visualizing strain in epitaxial graphene grown on boron nitride (BN)
Mapping graphene grain orientation
Characterization of a photoswitchable MoS₂ diode
Tuning band gap of a tungsten diselenide (WSe₂) transistor<
Interfacial phenomena in graphene

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