Learn How to Probe Samples Under Applied Magnetic Fields
The latest Variable Field Module (VFM4) for MFP-3D atomic force microscopes can apply both in-plane and out-of-plane magnetic fields
Learn about the features and benefits of the VFM4:
- Apply in-plane fields up to ±8000 G
- Apply out-of-plane fields up to ±1200 G
- Field strength is adjustable from software
- Unique using permanent magnets eliminates the heating and drift associated with electromagnets
You might also be interested in our recent application note, " Force Microscopy Under Applied Perpendicular Fields with Asylum Research AFMs." It discusses two case studies: 1) Domain structure in a Co/Ni that exhibits perpendicular anisotropy, and, 2) Direct observation of skyrmions under applied fields.