Learn How to Probe Samples Under Applied Magnetic Fields

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)

Learn about the features and benefits of the VFM4:

• Apply in-plane fields up to ±8000 G
• Apply out-of-plane fields up to ±1200 G
• Field strength is adjustable from software
• Unique using permanent magnets eliminates the heating and drift associated with electromagnets

You might also be interested in our recent application note, " Force Microscopy Under Applied Perpendicular Fields with Asylum Research AFMs." It discusses two case studies:  1) Domain structure in a Co/Ni  that exhibits perpendicular anisotropy, and, 2) Direct observation of skyrmions under applied fields.