Learn how the Interferometric Displacement Sensor (IDS) Option for Asylum Research Cypher AFMs "Quantifies the Last Axis"

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)

Improved measurement reproducibility for electromechanical response in piezo- and ferro- electric materials

• Electromechanical measurements are free of frequency-dependent artifacts
• Correctly measures 180° phase shift across oppositely polarized domains

Accurate Spring Constant Calibration

• Accurately measures the spring constant of any eigenmode up to 2.5 MHz.
• Does not require any assumptions or measurements of cantilever mode shapes because the IDS sensitivity requires no calibration

Cantilever Mode Shape Mapping

• Allows direct measurement of cantilever modes shapes in any medium
• Unlike modeling, mode mapping with the IDS does not require any assumptions about the cantilever shape and properties