牛津仪器集团成员
扩展

Asylum Research Webinar: Asylum Tools for Characterizing Materials

 

Description

Dr. Andras Kis of EPFL Institute of Electrical Engineering and Keith Jones, Asylum Research's nanoelectrical characterization specialist, are your hosts. They discuss the integral role of in materials research and present tools and techniques to successfully characterize a variety of materials used for device manufacturing, energy storage and optoelectronics. Learn about modes for mapping physical properties and see how they can evaluate local electrical, mechanical and functional response. They also discuss how can now be used to accurately determine the thickness of single or multiple layers of a , challenging a common misconception.

Included are results on the following studies:

  • Molybdenum disulfide (MoS2) and
  • Measurements of mechanical properties
  • Kelvin imaging (KPFM) of operating transistors
  • Electrical characterization
  • Detailed discussions of these modes:
    • KPFM
    • Piezoresponse force microscopy (PFM)
    • Conductive
    • Scanning impedance imaging (sMIM)

About Your Lecturers:

Andras Kis is an Associate Professor at Ecole Polytechnique Federale de Lausanne (EPFL), School of Engineering (STI), Institute of Electrical Engineering (IEL) with a research focus in developing materials. His group demonstrated the first transistor based on a . He has more than 16 years of experience, including 63 peer-reviewed papers, more than 50 invited talks at scientific meetings, and participation in organization committees for numerous materials and conferences. He has also been the editor-in-chief for Partner Journal, “ Materials and Applications”. Prof. Kis received his PhD from EPFL and did his post doc at Univ. of California Berkeley, Zettl Lab.

Keith Jones is an Application Scientist at Instruments Asylum Research (12 years). He has more than 18 years of SPM experience specializing in nanoelectrical characterization and was instrumental in developing and applying electrical techniques, such as dopant profiling and scanning impedance microscopy. Keith is also a co-inventor on a patent for scanning impedance microscopy and has co-authored 34 published papers. Keith received his M.S. in at Virginia Commonwealth University.

沪ICP备17031777号-1 公安机关备案号31010402003473