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Analysing Polymer Additives

有关: 聚合物

Atomic Force Microscopy (AFM) is a powerful tool for studying the nanoscale morphology and mechanical, electrical, and functional properties of polymers. Please refer to the pages linked below for in-depth reviews of applications in this area.

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Jupiter XR原子力显微镜的快速力成像模式能够在高速(最高达2500 Hz)测量“力-距离”曲线的同时,捕获到图像中的每一条曲线。实时和离线分析模型均可用于计算模量、附着力和其他性能。

快速力成像模式(FFM)

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